Rupich M.W., Li X., Zhang W., Kodenkandath T., Goyal A., Aytug T., Paranthaman M.P., Leonard K.J., Sathyamurthy S., Bhuiyan M.S., Kim K., Martin P.M., Li J., Fayek M.
Rupich M.W., Li X., Zhang W., Kodenkandath T., Goyal A., Specht E.D., Paranthaman M., Martin P.M., Li J., Gapud A.
Zhang W., Huang Y., Li X., Kodenkandath T., Rupich M.W., Schoop U., Verebelyi D.T., Thieme C.L., Siegal E., Holesinger T.G., Maiorov B., Civale L., Miller D.J., Maroni V.A., Li J., Martin P.M., Specht E.D., Goyal A., Paranthaman M.P.
Paranthaman M., Aytug T., Leonard K.J., Sathyamurthy S., Bhuiyan M.S., Kang S., Martin P.M., Hunt R.D.
Ключевые слова: solution techniques, nanoscaled effects, HTS, YBCO, nanodoping, pinning, fabrication, Jc/B curves, critical caracteristics
Ключевые слова: HTS, REBCO, RABITS process, nanodots, YBCO, comparison, Jc/B curves, angular dependence, experimental results, fabrication, critical caracteristics
Paranthaman M., Aytug T., Christen D.K., Thompson J.R., Kang S., Martin P.M., Varela M., Gapud A.A., Raitano J.M., Chan S.-W.
Ключевые слова: HTS, YBCO, films, substrate SrTiO3, buffer layers, nanoscaled effects, surface, pinning, Jc/B curves, angular dependence, critical current density, critical caracteristics
Kang S., Goyal A.(goyala@ornl.gov), Li J., Gapud A.A., Martin P.M., Heatherly L., Thompson J.R., Christen D.K., List F.A., Paranthaman M., Lee D.F.
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, nanodots, defects columnar, angular dependence, temperature dependence, pinning, fabrication
Goyal A., Heatherly L., Martin P.M., Wee S.H.(wees@ornl.gov)
Ключевые слова: HTS, REBCO, RABITS process, PLD process, films epitaxial, coated conductors, Jc/B curves, angular dependence, fabrication, critical caracteristics
Goyal A., Paranthaman M., Heatherly L., Martin P.M., Li J., Wee S.H.(wees@ornl.gov)
Thieme C.L., Li X., Kodenkandath T., Goyal A., Heatherly L., Sathyamurthy S., Martin P.M., Rupich M.W.(mrupich@amsuper.com), Paranthaman M.P.(paranthamanm@ornl.gov)
Ключевые слова: HTS, YBCO, coated conductors, MOD process, buffer layers, chemical solution deposition, substrate Ni-W, fabrication
Goyal A., Paranthaman M., Aytug T., Christen D.K., Heatherly L., Leonard K.J., Thompson J.R., Kang S., Martin P.M., Ijaduola A.O., Rusakova I., Meng R., Chu C.W.(cwchu@uh.edu)
Ключевые слова: HTS, YBCO, films, substrate metallic, substrate single crystal, nanoscaled effects, nanoscaled roughness, pinning, Jc/B curves, temperature dependence, pinning force, irreversibility fields, angular dependence, microstructure, experimental results, critical caracteristics, magnetic properties
Goyal A., Paranthaman M., Heatherly L., Leonard K.J., Lee D.F., List F.A., Cook S.W., Martin P.M., Rouleau C.M., Christen H.M.(christenhm@ornl.gov)
Goyal A., Paranthaman M., Heatherly L., Leonard K.J., Lee D.F.(leedf@ornl.gov), List F.A., Cook S.W., Martin P.M., Christen H.M., Rouleau C.M.
Ключевые слова: HTS, YBCO, coated conductors, pulsed electron deposition, ex-situ process, RABITS process, precursors, Jc/B curves, fabrication, critical caracteristics
Specht E.D., Paranthaman M., Christen D.K., Leonard K.J., Thompson J.R., Kang S., List F.A., Martin P.M., Varela M., Pennycook S.J., Ijaduola A.O., Gapud A.A., Goyal A.(goyala@ornl.gov)
Ключевые слова: HTS, YBCO, films, nanodots, defects columnar, pinning, microstructure, Jc/B curves, anisotropy, fabrication, experimental results, critical caracteristics
Goyal A., Paranthaman M., Aytug T., Christen D.K., Leonard K.J., Thompson J.R., Martin P.M., Zhai H.Y., Gapud A.A.
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, seed layers, barriers, oxygen diffusion, Jc/B curves, fabrication, critical caracteristics
Goyal A., Paranthaman M., Leonard K.J., Sathyamurthy S., Kroeger D.M., Lee D.F.(leedf@ornl.gov), Jr L.H., Yoo J., List F.A., Rutter N., Cook S.W., Martin P.M.
Goyal A., Paranthaman M., Christen D.K., Leonard K.J., Thompson J.R., Martin P.M., Zhai H.Y., Aytug T.(aytugt@ornl.gov), Gapud A.A.
Goyal A., Paranthaman M., Heatherly L., Leonard K.J., Kroeger D.M., Lee D.F., List F.A., Martin P.M., Cook S., Gapud A.A., Yoo J.(yooj@ornl.gov), Hsu H.S.
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